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Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
- Pickering Interfaces Inc.
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Diagnostic Test Tool
BIRST™ (Built-In Relay Self-Test)
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Veracode Dynamic Analysis
DAST
Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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Ring Wave Generator
SKS-1206IA/SKS-1206IB
Shanghai Sanki Electronic Industries Co., Ltd.
The ring wave generator is fully compliant with the new standards of IEC61000-4-12 and GB/T17626.12. The interface contains standard differences between IEC and Chinese national standards. Users can choose to enter the corresponding interface to perform different Test: Program -controlled high-voltage power supply and electronic switch have the characteristics of high precision, long life and good reproducibility.
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Impedance Analyzer 10MHz-20Hz
IA1021
Feature Specifications: Dual test mode: Analyzer(frequency sweep) and LCR(single frequency).Measurement frequency: 20Hz to 10MHz, 6 digitsFrequency resolution: 0.001% in all frequency rangeFrequency accuracy: 0.01%.DC bias(program): -10V ~ +10V, 0.005V resolution, accuracy 0.5%.Measurement basic accuracy: Impedance +-0.2%, phase: +-0.1°.Display Range: Z: 0.0000Ω-99.999MΩ.
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onTAP DLL
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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Highly Accelerated Stress Screening (HASS) Test
HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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TestCentre
ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.
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PCIe-7821, Kintex 7 FPGA, Digital Reconfigurable I/O Device
785359-01
The PCIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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JTAG Test Software
JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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Solar Spectrum Test Chamber / Solar Radiation Test Chamber
WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. Weiber provide Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Weiber provide Solar Simulation Test Chamber.
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FD-11601, 8-Channel, ±10 V Powered-Sensor Voltage Input Device for FieldDAQ
786374-01
The FD-11601 measures up to eight channels with a voltage input range of ±10 V. Each input channel supports TEDS and provides 24 V DC to power external-powered sensors without additional power supplies. The FD-11601 features 24-bit resolution, simultaneous sample rates up to 100 kS/s/ch, and channel-to-channel isolation. It is IP65/IP67 rated to be dust-tight and water-submersible, operates in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11601 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11601 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11601 is ideal for test cell and outdoor environments.
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Modbus Diagnostic Program
Modsak
Modsak is a versatile Modbus diagnostic program. It will be of interest to device manufacturers, software developers, system integrators and field service engineers. Modsak can be used to test or simulate almost any device or system that uses the Modbus protocol: slave devices, PLC's, HMI's, MMI's, DCS's, RTU's, SCADA systems, bridges, gateways, device servers, etc.
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Automated Test Environment
AS5657-ATE
The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.
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High Performance EV Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
The 6V series battery test system uses a full-bridge circuit topology with a higher digit sampling chip. It can provide higher precision and more dynamic test data, and can provide a complete test program for mainstream lithium-ion batteries and batteries with a variety of material systems such as sodium batteries.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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High Strength Electro-hydraulic Servo Universal Testing Machine
WAW-H Series
Jinan Testing Equipment IE Corporation
WAW-H series Servo-Hydraulic Testing Machine Computerized is suitable for testing tension, compression, bending and shearing strength of various metallic & non-metallic materials. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the predetermined programs. The Servo-Hydraulic Testing Machine Computerized can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The Servo-Hydraulic Testing Machine Computerized is easy to operate and is versatile in the applications of metallurgy manufacturers such as steel mills & alloy, reinforced bar, aircraft industry, research institutes, laboratories, calibration institutes etc.WAW-H series Servo-Hydraulic Testing Machine Computerized is suitable for testing tension, compression, bending and shearing strength of various metallic & non-metallic materials. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the predetermined programs. The Servo-Hydraulic Testing Machine Computerized can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The Servo-Hydraulic Testing Machine Computerized is easy to operate and is versatile in the applications of metallurgy manufacturers such as steel mills & alloy, reinforced bar, aircraft industry, research institutes, laboratories, calibration institutes etc.
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Test Adapter
FECVF1600
Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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VCS
Test Specimen Parameters
a program from the scope of ZETLAB VIBRO software suite. The update of the software suite ZETLAB VIBRO includes a new user-friendly interface as well as a wide range of new functions, allowing the user to configure parameters of the vibration test system with the maximal possible prevention of errors occurrence.
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In Circuit Test Service
In Circuit Test Program Development. Provide you with programming and fixture build as well as schematic review. Will order the fixture from one of our preferred vendors or any Fixture Vendor you prefer.
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Power Conversion Automated Test Platform
C8000
Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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DC Power Analyzer, Modular, 600 W, 4 Slots
N6705C
The N6705C DC Power Analyzer provides unrivaled productivity gains for sourcing and measuring DC voltage and current into the DUT by integrating up to 4 advanced power supplies with DMM, Scope, Arb, and Data Logger features. The N6705C eliminates the need to gather multiple pieces of equipment and create complex test setups including transducers (such as current probes and shunts) to measure current into your DUT. The DC Power Analyzer also eliminates the need to develop and debug programs to control a collection of instruments and take useful measurements because all functions and measurements are available at the front panel. For even greater control and analysis functions, the DC Power Analyzer can be used with the 14585A Control and Analysis Software. When automated bench setups are required, the N6705C is fully programmable over GPIB, USB, LAN and is LXI Compliant. 14585A Control and Analysis Software
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Test & Measurement Products
We offer a broad range of test and measurement devices for your scientific, educational, industrial, and process applications. We carry the test and measurements tools you need to analyze, validate, and verify measurements in your electronic and mechanical systems, ensuring compliance to quality assurance and quality control programs. Our selection features portable and bench oscilloscopes, multimeters (DMMs), clamp meters, megohmmeters, stroboscopes and tachometers, power transformers, along with precision meters for humidity, moisture, light, airflow, weather, and vibration.
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Calibrated Leak Standards
LeakMaster is a leader in the industry when it comes to the manufacturing of calibrated leak standards (calibrated leak orifices). Each leak standard is meticulously manufactured to a specific leak or flow rate at a predetermined pressure. The purpose of each leak standard is to teach, or calibrate a leak test program, and allow the leak test instrument to memorize the characteristics of a leaking part. These leaks are also introduced into production parts to simulate a “leaking or failed” part condition. LeakMaster supplies a calibrated leak standard with every leak test instrument, and provides recertification services for all of their leak standards
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Analytical Services
S.D. Myers, Inc. Laboratory has provided Analytical Services since our company was founded in 1965. We provide laboratory analysis of electrical insulating liquids and electronic data management services. We also review, interpret, and analyze test data from our laboratory and from other sources to provide our customers with clear and unambiguous recommendations concerning their electrical equipment maintenance programs.
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Certification Programs
With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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S500 Test Solution
The S500 Bench Test Equipment (BTE) is customized to test the Line Replaceable Unit (LRU) to determine the faulty Lowest Level Replaceable Unit (LLRU). Once a faulty LLRU is discovered, a separate application program specifically designed for the LLRU is executed to further isolate the fault.
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Probe System
Acculogic FLS 980 Dxi
Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.
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6000 Series Digital I/O Modules
Series 6000 digital I/O modules record signals from frequency counters, flow meters, encoders, discrete transducers, IRIG time, etc. which are often part of the test environment. These digital signals are time aligned and recorded alongside the system’s analog measurements. High density digital inputs provide an opportunity to easily include facility controls like switches, valve positions, relays, lights, etc. along with the test data. Series 6000 digital I/O modules also provide outputs generated by user command or automatically by Sequence, Alarms or DSP. User generated outputs are accomplished in software while sequencers can be programmed prior to a test and initiated by program or hardware control. Alarm conditions preprogrammed on the analog side can automatically generate digital outputs which are typically connected to facility control systems or PLCs. A DSP adds powerful real-time processing and is appropriate for PID control loops, derived parameter calculations and a variety of other real-time operations.
