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Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
- NovaTech Automation
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Test Switch
The W3TS Test Switch, a miniature knife blade switch (5/8 inch centers including barrier) with #10-32 stud terminals, is available in three types: Basic Switch, Short-Circuiting Switch (Shorting Switch), Test Jack Switch
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Firmware Engineering Projects
Precision Development Consulting Inc
Hand control module for teleprompter, Analog data acquisition and filtering, High-Power Arc Lamp Power Supply Controller and RTP gas flow and Vacuum System controller, Disk drive company test racks, Disk Drive Spindle Motor Tester, Disk Drive Head Stack Tester, Wafer photoresist coating and development system control PC boards, Nuclear Plant secondary water temperature monitor
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MEMS-Scanner Evaluation-Kit
The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized trajectory supplied. The component is held by a scan head, which is also included in the scope of delivery and which, thanks to its special construction, can easily be integrated into common optical test setups. Depending on the design of the MEMS component, controlled operation of the component and synchronized operation of the resonant axis are also possible. The function is controlled by software that communicates with the electronics via USB.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Bench Type Panel Meter
ED-205
Standard Electric Works Co., Ltd
● Dimension：91(L) × 103(W) × 100(D)mm● Deflection Angle : 90°● Scale Length：Approx. 65mm ● Terminal： 4mm socket captive head, suitable for wire or pin-type test lead.● Material And Color： Acrylic resin meter cover, white scale plate, plastic stand in black.● Safety Standard： IEC/EN 61010-1 CAT Ⅱ 300V EN 61326-1 EN 61000-4-2 EN 61000-4-3
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Head Expanders
By increasing the mounting area of the shaker, multiple items can be tested at the same time, decreasing total test cycle time. In addition, with Guided Head Expanders, payloads with large foot prints can be safely mounted and tested on the shaker, minimizing the risk of damage to the shaker suspension system. Although many head expanders are resonant below 1000 Hz, average or extremal control allows operation to 2000 Hz.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Welding Resistance Tester
WRT
The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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Manual Test Adapter
linear pin compressionhinged carrier for probe cardfacilitated probe tower positioningmounted onto test head stiffener
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Pod/Nest Fixtures
Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing. Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.
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Portable Hardness Tester
Magnetic Type QualiMag Series
The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell test head fixes to the surface of iron and steel parts to test the hardness by applying magnetic force. Meant to replace Leeb hardness testers which are not as accurate nor reliable. Use the Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester on steel parts, steel plates, steel pipes, forgings, large to medium sized heat treated parts(if surface available), welding joints, pressure vessels, etc. The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell complies with Standards ISO 6508 and ASTM E18.
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Air Permeability Tester
TF164B
TESTEX Testing Equipment Systems Ltd.
Our Air Permeability Tester determines the resistance of fabrics (woven, knitted and non-woven textile materials) to the passage of air (air flow) under constant pre-set air pressure while firmly clamped in the test rig of selected test head/area.The specimen is loaded to the test area of the instrument easily by means of a pneumatic holder. By pressing down the holder to start the test. The air permeability tester is equipped with a vacuum pump to draw air through an automatic interchangeable test head with a circular opening. The pre-selected test pressure is automatically maintained, and after a few seconds the air permeability of the test specimen is digitally displayed in the pre-selected unit of measure on the touch panel after test the holder is released and the vacuum pump is shut off.
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Custom Magnetic Recording Heads
International Electro-Magnetics, Inc.
We have manufactured over 5,000 different head designs. If we don't have one to suit your requirements, we will design and build to your specification. Our toolroom is well equipped to produce precision parts, and our design projects have included flux sensing systems, magnetic disk encoding, and electronic test equipment.
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Magnetic Particle Liquid Checker
S-2A / S-2B
Magnetic particle liquid checker S-2 series is a test bar which can directly check the quality of magnetic particle liquid immediately. Magnetic particle liquid checker S-2A type has a sensor at the head of straight test bar.
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Test Contactor/Probe Head
Atlas
QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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Power device test system
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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DDR4 Pro 288-Pin DIMM Adapter
INN-8686-18-PRO
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
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HD Tester with VGA, Audio, Video, HD-TVI
M-HD-360A
Fuzhou Metricu Technology Co Ltd
Analog camera testHD-TVI camera test, HD-CVI camera test, AHD camera testDC12V 1A power outputVGA input, support 1920 x 1200P 60FPSAuto HD, auto recognize HD coax camera type and resolutionUTP cable test, detect the near-end, mid-end and far-end fault point of the network cable crystal head
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Remote Radio Head Test, Reference Solution
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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Signal Integrity Test Products
S1
*Fixtureless Test Solution*Automated Optical Inspection*DC Electrical test*Tests any backplane – Small, large, simple, complex*Now available with 4 heads
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Optical Power Meter with Optical Head
GM8012 + 2 X GM8300X
The UC8820 + 2 X UC8820X optical power meter with optical head offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, and other general purpose of fiber optical test and measurement applications. It is special design for volume production line application.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
