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- Taylor Dynamometer, Inc.
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400 HP Complete Bench Hydraulic Test Center
HTC-400
The Hydraulic Test Center (HTC) is a versatile machine designed to test heavy-duty, off-highway hydraulic components. The 400 hp (298 kW) HTC Complete Bench is for the dealer that services components from a predominately medium size machine mix such as large construction equipment (loaders, dozers, excavators).The Complete Bench offers full functionality to test all types of pumps and motors including: transmissions, hydraulic motors, hydraulic cylinders, valve blocks, torque converters, open and closed loop pumps.
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Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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High-Density Precision SMU (100 PA, 30 V)
PZ2130A
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Line Testers
GAOTek provides a large collection of certified and feature-rich line testers for sale to the United States, Canada and Globally. These devices are mainly used for line installation, line performance testing, inspection, and maintenance of the telecommunication networks. They are particularly designed to accelerate telecom trouble shooting and with the help of latest technology they are equipped with a smart CPU, IC, and SMT. These devices have some unique features such as caller ID display and last number redial. Moreover, it can also be used for multi-line testing, wire pair checking, inspection of line insulation and test for breaks and faults.
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Steam Aging Tester
Wewon Environmental Chambers Co, Ltd.
These steam aging chamber applied for the testing of sealing property for multi-layer circuit board, IC sealing package, LCD screen, LED, semi-conductor, magnetic materials, NdFeB, rare earths and magnet iron, in which the resistance to pressure and air tightness for above mentioned products can be tested out. ● Overall of the steam aging tester made of stainless steel SUS # 304HL, simple operation settings. Microcomputer digital LED control with time planning function , the maximum set 9,990 Mins. ● Parts, connectors, passive components , semiconductors oxidation test pin high temperature and humidity. ● Metal pin soldering test accelerated aging test. Multiple overtemperature protection / water cut heating and other safety devices. ● The touch- PID + SSR temperature controller, timer function while a time , set the 9990 maximum fractional unlimited.
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Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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End-of-Line IC & MEMS Tester
igentic® 841t
Integrated circuit (IC) and micro electro-mechanical system (MEMS) device manufacturers need to address the challenges of today's global market including increased functionality, speed and complexity while delivering components at reduced costs. Sterner Automation's igentic® 841t automated test systems meet these demanding requirements by providing a flexible platform for comprehensive end-of-line IC and MEMS device handling, testing, grading and packaging. The resulting improvements in quality assurance and process efficiency will maximize customer satisfaction and profitability.
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Manual Switch Boxes
RTI's manual switch box is a portable and versatile test solution for quick IC electrical verification tests. RTI's 96-pin manual switch boxes integrate with a variety of test configurations that are customized to your test and device needs. It requires no software and connects directly to an external power supply for bias test, and performs quick comparison tests using an A/B relay box.
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Steam Aging Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Steam aging test chamber is a climatic test machine used to judge the products performance to resist extreme circumstance under high temperature, high humidity and high pressure during the transportation, storage and usage. The principle is very simple, water in the tank is heated turning into steam to form a simulated test environment under specified temperature and humidity. Specimens are placed into the drawers of machine to carry out test lasting for preselected time. It is applicable to electronic connectors, semiconductor IC, transistor, LCD, diodes, resistances etc.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Design-for-Test And Semiconductor Data Analytics
Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
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RF & Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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Portable Ultrasonic Flaw Detector
MFD500B
Mfd500b portable ultrasonic flaw detector adopte the international advanced ic technique and new-style color tft lcd display. Its each performance index all arrive or even beyond international excellence. The instrument use the artificial intelligence technology. It has very strong function and can be used very convenient. Mfd500b can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in worklpiece’s interior swiftly and accurately without any destruction. It can not only be used in lab but also can be used on engineering site. Also, it can be widely used for safety checking and life evaluating in fields of aeronautics, rail transportation and boiler pressure vessel.
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Pin Point Range Systems
The PinPoint Alpha system is a flexible, adaptable and modular PCB and IC fault finding system, which allows you to apply different electronic test methods to obtain maximum test coverage and fault detection. Test signals can be applied at the PCB edge connector or through test clips and DTIs to perform fixtureless in-circuit testing.
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
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High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)
PZ2121A
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5114
Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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Dip Clip, 16 Pin With Nickel Silver Contacts
3916A
Dip Clip, 16 pin with Nickel Silver contacts. Pomona DIP Clip® test clips are designed for testing dual-in-line IC packages on PC boards. These devices incorporate many built-in features that assure a positive electrical connection as well as hands free testing.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
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Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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PXIe Digital Stimulus/Response with PPMU: 250 MHz, 16 Channels
M9195B
The Keysight M9195B PXIe digital stimulus/response (PXI DSR) module is ideal for IC design validation and production test environments. The PXI DSR provides 16 bi-directional digital channels with programmable logic levels and can be configured for synchronized cyclized digital data, for parametric measurements, or for static digital IO.
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
