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- Scientific Test, Inc.
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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Rad Hard GaN FETs
Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
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Precision Low Power FGA™ Voltage References
ISL60002
The ISL60002 FGA™ voltage references are very high precision analog voltage references fabricated on Renesas' proprietary Floating Gate Analog technology and feature low supply voltage operation at ultra-low 350nA operating current. Additionally, the ISL60002 family features guaranteed initial accuracy as low as ±1.0mV and 20ppm/°C temperature coefficient. The initial accuracy and temperature stability performance of the ISL60002 family, plus the low supply voltage and 350nA power consumption, eliminates the need to compromise thermal stability for reduced power consumption making it an ideal companion to high resolution, low power data conversion systems.
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Charge Integrator Amplifiers
AD8488
Analog Devices’ charge integrator amplifiers convert the charge acquired by X-ray or photodiode detectors to a voltage. The channels are composed of CMOS transistors, using typical high input impedance CMOS gates. The integrators generate charge dependent voltages using a range of selectable capacitance values that accommodate a broad range of input charge values. The integrators are followed by single-ended input to differential output voltage amplifiers where offset and low frequency noise voltages are subtracted from the input voltages.
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Inductive Sensors
Inductive sensor designed to detect shaft speed, shaft position, gate position, or object presenceTotally sealed constructionMulti-voltage 24 - 240 VAC/VDCDetects ferrous targets up to 5/16" (8 mm)IP 65 Protection
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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360 EC-RTL
During a typical development process, there are many occasions where a change needs to be made to a block, which must then be retested to ensure functional equivalence. For example, once a block has been proven to operate correctly, a designer may wish to optimize some section, maybe to improve the coding style, reduce the gate count or streamline operation. Today, an engineer must execute an entire simulation regression run to verify each change. This often requires a lot of time and may also need additional stimulus, with no guarantee that an exhaustive functional check will be performed.
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AdvintRIO™ Reconfigurable I/O
SNAKEHEAD
The Snakehead platform employs aNI CompactRIO (cRIO) system consisting of an embedded controller, chassis, and NI C Series I/O modules.Snakehead systems are not dependent on a separate host computer. They offer both Ethernet, and Wi-Fi connectivity to powerful real-time controller with a user-upgradable backplane that includes a high performance field-programmable gate array (FPGA). Snakehead provides stand-alone embedded execution for deterministic LabVIEW Real-Time applications. These units are designed for ruggedness, reliability, and low power consumption. The heart of Snakehead systems is the reconfigurable I/O (RIO) FPGA core. The RIO core has an individual connection to each I/O module and is programmed using easy to use elemental I/O functions to read or write signal information from each module
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P-Series Single Channel Power Meter
N1911A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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MOSFET Drivers
Renesas' product portfolio includes MOSFET gate drivers for 3-phase motor applications. The drivers have built-in detection/protection functions and are suitable for inverter driver applications such as EGR, HVAC and EPS. Line up the products with LDOs for MCU, 24V battery system capability, built-in current sense amplifiers, and motor angle detection function. The products support unit downsizing and high performance.
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Saturable Reactor Inductors
Osborne Saturable Reactors are designed to provide a variable output voltage through the use of variable impedance connected in series with a constant impedance load. Each saturable reactor’s impedance is determined by the application of DC power to a control winding. As the level of power supplied to the control winding is increased, the saturable reactor becomes more saturated. This reduces the impedance of the AC gate winding, and increase the amount of the supply voltage that is transferred to the load. Conversely, as the power is reduced to the control winding, the reactor becomes less saturated, the gate winding has more impedance and less of the input voltage is provided to the output impedance. This approach provides excellent quality, reliability, and control when designed to match the requirements of a specific application.
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CompuScope GPU CUDA Processing
Performing real-time digital signal processing (DSP) routines such as Fast Fourier Transform (FFT), Signal Averaging, Finite Impulse Response (FIR) Filtering, Digital Down Conversion (DDC) and more have traditionally required the use of dedicated DSP processors, Field Programmable Gate Arrays (FPGAs), or Application Specific Integrated Circuits (ASICs).
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Brushless DC Drivers (BLDC)
Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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Brush DC Drivers
Allegro provides a broad portfolio of safe and robust brush DC solutions. With both integrated and MOSFET gate drives our product lines are ideal for low- and high-power applications alike. Increased digital content with embedded drive algorithms simplify your implementation, while enhanced diagnostics and protection features ensure a safe and reliable solution.
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Gate Drivers
A necessary companion for discrete power MOSFETs and IGBTs as well as digital – microcontrollers, DSPs and FPGs – or analog controllers in any switched-mode power converter, STDRIVE gate drivers generate the necessary voltage and current level required to accurately and efficiently activate the power stage in industrial, consumer, computer and automotive applications.
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Precision SOT-23 FGA™ Voltage References
X60003
The X60003 FGA™ voltage references is a very high precision analog voltage reference fabricated in Renesas' proprietary Floating Gate Analog technology, which achieves superior levels of performance when compared to conventional band gap, buried zener or XFET™ technologies.
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Inspector / Traffic Data Manager
Inspector is a scalable platform able to centralize the data acquired from different cameras distributed on the field. The system is scalable and extensible to perform average speed enforcement control, security applications, traffic statistics and access control. Inspector can analyze collected data according to configurable rules and undertake a number of actions based on the results: opening gates, sending emails, posting messages on variable message panels.
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Low Noise Amplifiers (NF < 3 DB)
Qorvo offers a variety of transistors and amplifiers with industry-leading low noise performance. We provide multiple product solutions, ranging from discrete transistors, packaged MMIC solutions incorporating internal matching and on-chip linearization, and dual amplifiers for use as push-pull or balanced amplifier configurations. Qorvo's LNAs are manufactured using our pHEMT processes with 0.15 µm, 0.25 µm or 0.5 µm gate lengths.
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24 TTL Channels, Enhanced, Programmable I/O
TL2
Function module TL2 provides 24 channels of TTL/CMOS transceiver functionality as either inputs or outputs. The transistor-transistor logic (TTL) employs transmitters with multiple emitters in gates having more than one input. TTL offers high switching speed and relative immunity to noisy systems. CMOS sensors provide image sensing technology by converting light waves into signals that are small bursts of current. These waves can be light or other electromagnetic radiation.
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ORing FET Control
Renesas' ORing MOSFET Controllers with a suitably sized N-Channel power MOSFET(s) increase power distribution efficiency and availability when replacing a power ORing diode in high-current applications. They provide gate drive voltage for the MOSFET(s) with a fully integrated charge pump.
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test measurement unit
ITC59100 Rg/Qg
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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1.3GHz Frequency Counter
Model 1122 / 1122X
- Wide Frequency Range 0.2Hz to 1.3GHz- 2 Separate Channels, for LOW & HIGH Frequencies- High Sensitivity- 8 Digit Green LED Display- Microcontroller based Advance Technology- Optional RS232 Interface- Reciprocal Counting Technique for High Resolution at Low Frequency- Period Measurement- Low Pass Filter for Noisy Low Frequency (<100KHz)- 4 Selectable Gates (10ms, 100ms, 1sec, 10sec)
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0.1Hz-3.7GHz Frequency Counter
FC-3000
Features:*Frequency measuring range: 0.1Hz to 100MHz in A input, 80 MHz to 3.0GHz in C input.*Period,Total and RPM measurement for input A*9 Digit display with 0.01mHz resolution in 1 Sec (By Ext.Reference signal).*RS-232C serial interface function for communication with computer.*High sensitivity Extemal reference input function(>=1.5Vrms).*Peciprocal technique for high resolution at low counting frequencies .*Self check function executed to perform a automatic self diagnosis of various counter function.*Push-scanning for selecting Function and Gate time.*Low-pass filter(100KHz,-3dB)installed for removing noise signsl in low frequency measuring.*AC/DC coupling function(Selectable AC/CD Coupling)*10:1 Input Attenuation(Selectable×1/×10 Attenuator)*Data hold function
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Firmware
Field-Programmable Gate Arrays (FPGAs) are an ideal fit for data acquisition systems as they offer unparalleled real-time signal processing power. Moving functionality from the host PC to the on-board FPGAs helps offload the PCs central processing unit (CPU) and relaxes data transfer rate requirements. This capability is key in achieving the performance levels needed in many of today's leading-edge applications.All our data acquisition and generation modules host Xilinx FPGAs and are delivered with pre-installed general data acquisition firmware (for ADQ7 and ADQ14 we refer to this firmware as "FWDAQ"). In addition to the standard/default firmware, we also offer optional firmware development kits (available for all models) and application-specific firmware packages (available for ADQ7 and ADQ14 only). More information about these below.
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Signal Generators
NF‘s function generators have been used in many applications, since NF produced the first Japan-built function generator in 1959.A function generator is general-purpose test equipment used to generate various waveforms and to execute trigger, sweep and gate oscillation.
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Alchitry Cu FPGA Development Board (Lattice ICE40 HX)
If you are not needing a lot of power to start your FPGA adventure, or are looking for a more economical option, the Alchitry Cu FPGA Development Board might be the perfect option for you! The Alchitry Cu is a "lighter" FPGA version than the Alchitry Au but still offers something completely unique. FPGAs, or Field-Programmable Gate Arrays, are an advanced development board type for engineers and hobbyists alike to experience the next step in programming with electronics. The Cu truly exemplifies the trend of more affordable and increasingly powerful FPGA boards arriving each year. This board is a fantastic starting point into the world of FPGAs and the heart of your next project. Finally, now that this board is built by SparkFun, we added a Qwiic connector for easy I2C integration!
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Ku-Band Antenna Systems
A complete line of Ku-Band and Ka-Band SATCOM antenna systems featuring TECOM technology for non-stop gate to gate in-flight connectivity for commercial large Air Transport, Business Jet and various military applications.
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Photo Gate Logger Sensor
NUL-209
This sensor can be used to study various kinds of motion. With six modes of operation, time, velocity or acceleration can be measured with one or two photo gates and associated timing cards, as well as showing pictorially the status (digital 1 or 0) of the voltage output of the photo gate as timing cards pass through it.