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Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Analytical Services
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Materials And Chemical Analysis
Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
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Chemical Analysis
Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Chemical Testing
Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Spectroscopy
NIRS Analyzer PRO
The NIRS Analyzer PRO is a system for the nondestructive, direct analysis of granules, powders, liquids, slurries, or opalescent substances.
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Terahertz Wave Spectroscopy And Imaging Analysis Platform
TAS7500TS
The TAS7500TS is a Terahertz (THz) analysis system consisting of an optical fiber laser module and a data acquisition module, which are core parts of our terahertz spectroscopy system (TAS7500SP). Users complete the THz measurement system setup by simply connecting one of Advantest's THz source modules (TAS1110/TAS1130) and a detector module (TAS1230; sources and detectors sold separately). Flexible source selection and source/detector placement allows the user to generate customized experimental configurations.
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Chemical Analysis
The chemists at IMR have numerous analytical tools at their disposal, all geared toward providing accurate, NIST traceable analyses of metals and process solutions. The staff is experienced, professional, and knowledgeable in the latest analytical techniques.
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Spectroscopy
Metrohm Instant Raman Analyzers
Handheld spectrometer for quick and easy identification of unknown substances
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Raman Spectroscopy Analysis Laboratory
Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Spectroscopy Card
microDXP
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Raman Spectroscopy
Raman spectroscopy is a form of vibrational spectroscopy, like infrared (IR) absorption, that provides detailed chemical and structural characterisation. The Raman technique has the benefit of being non-destructive and requiring no sample preparation.
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Alpha Spectroscopy
Alpha spectroscopy is used to identify and quantify radionuclides based on the alpha particles emitted in the decay process. Similar to Gamma Spectroscopy, energy spectra are generated with high precision detectors and electronics and analyzed with special software. Typically, samples are measured following chemical separation to isolate the radionuclides of concern due to the complexity associated with correcting for these interferences with spectrum analysis software as is common for many Gamma Spectroscopy measurements.
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Impedance Spectroscopy
NuVant EZware-EIS Software Package
The NuVant EZware-EIS software package activates Electrochemical Impedance Spectroscopy on the EZstat-Pro, Powerstat-05 and -20 potentiostat/galvanostats. EZware-EIS exports the impedance data to a file format to accommodate free third party EIS analysis software. EZware-EIS is a user-friendly interface that allows selection of the proper scanning parameters, collect the impedance spectra, display data in Nyquist and/or Bode plots and export data in the proper data format for use in EIS analysis software.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
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Chemical Oxygen Demand (COD) Analyzer
PeCOD®
MANTECH’s revolutionary PeCOD® Analyzer technology provides accurate chemical oxygen demand (COD) results in 15 minutes — without the use of harmful chemicals including dichromate and mercury. Highly adaptable for wastewater and drinking water applications, the PeCOD® Analyzer’s patented nanotechnology-based approach to COD analysis will save you time and money while protecting the environment and the health and safety of your workers.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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NIR Spectroscopy Engines
Process control solution providers now have access to high performance micro-spectrometers designed to provide high resolution spectral data for Process Analytical Technology (PAT)/Pharmaceutical applications, real-time process control in Oil and Gas applications, and for general manufacturing process measurements with the IntegraSpec XL™. Excelitas' line of Axsun NIR Analyzers are designed to support methods development and provide for an easy conversion from the lab to the process environment.
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Metal-Organic Compound Chemical Vapor Deposition
Model MOCVD-500-A
For Experimental growth of quality epitaxial layers III-V, II-VI compounds. Multi-Layer structures. Directly heated silicon carbide coated, high purity graphite or PBN susceptor. Low mass thermocouple probe immersed into susceptor. Broad temperature and pressure application. Highest quality materials utilized throughout.
