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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- TEAM SOLUTIONS, INC.
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USB-controlled, FPGA Configurable Bit Pattern Generator
FAB-3226
The FAB-3226 system connects 16 bi-directional I/O ports to a user-defined FPGA logic. As the FPGA is user-programmable, all kinds of operations can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by a user-defined application program running on a computer system (PC or embedded).
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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Operational Intelligence platform
jKool
Operational Intelligence platform as a Service designed to derive meaning from high velocity machine data (FastData) in near real-time. It enables teams to analyze data from various sources such as applications (web, cloud, mobile), logs, transactions, mobile devices, IoT and help you make data driven decisions. Unified application analytics across apps and data silos. Detect patterns, bottlenecks, and anomalies within and across apps.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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32-CH 80 MB/s High-Speed Digital I/O Card
PCIe-7300A
ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.
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VME64x IP Carrier Module
DP-VME-5121
Data Patterns DP-VME-5121 VME IP carrier board is a 6U VME bus card that provides an electrical and mechanical interface for four industry standard IP modules. The board provides full data access to the IP modules I/O, ID and memory spaces. The programmable registers are used for configuring and controlling the operation of IP modules.Each IP module supports two interrupt requests. The VME bus interrupt level is software programmable. The software configured interrupt modes are:a.Single level interrupt mode: All IP module interrupts can be mapped to a single VME bus interrupt level.
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Infrared Thermometer Smart and Wireless Probe
805i
The testo 805i Smart Probe is an infrared (IR) thermometer that provides non-contact temperature readings; great for checking breakers, motors, ducts, and registers from a distance. The measurement area is indicated by a circular laser pattern which asssures accurate targeting measurement. Use the testo Smart Probes App to take photos of objects and include the laser pattern and the temperature reading for your reference. Easily adjust the emissivity within the App and store data as files or share via text or email. The testo 805i works on smart devices with either Android or Apple operating systems.
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PC-based logic analyser
Annie-USB
A top-quality 8-channel PC-based logic analyser with probably the highest specifications in its class, this Janatek product is excellent value for money. It captures data at a maximum rate of 500MHz, has a buffer depth of up to 1 Meg samples per channel, and incorporates an 8-bit pattern generator to aid debugging.
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PCI Fault Insertion Switch Range for Differential Serial Interfaces
50-200/201
Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.
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Ocean Surface Monitor
Current Monitor™
sigma S6 Current Monitor™ is a radar-based monitoring system that delivers ocean surface current data from moving stations and both current and bathymetry from fixed locations with high spatial resolution. This greatly improves the management of marine-based activities such as predicting oil slick drift patterns, enhancing navigational safety, and protecting vulnerable coastlines.
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AC Event Data Loggers
The Track-It™ AC Event Data Logger is a battery powered stand alone compact data logger that records up to 64,000 on/off cycles. Use the Track-It™ AC Event Data Logger to monitor cycle patterns of pumps, blowers and other electrical equipment powered by 120 or 240Vac.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
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Microsoft Graph Data Connect
Microsoft Graph is the Microsoft 365 data that describes the patterns of productivity, identity, and security in an organization. Microsoft Graph Data Connect offers developers a highly secure, efficient way to copy Microsoft Graph datasets, at scale, into Azure Data Factory. It's an ideal way to train AI and machine learning models that uncover rich organizational insights and deliver new value to your productivity solutions.
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Pattern Generators
Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Data Analytics Platform
CISC provides software modules to collect and analyze data from IoT devices. They can easily be integrated into any existing infrastructure. User-friendly reports and visualizations of the data provide comprehensive insight into what is happening in your business. Furthermore, our platform is able to diagnose and even predict failures as well as discover usage patterns or analyze performance.
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Portable PD Monitoring of Medium and High Voltage Power Equipment with UHF, AE, and HFCT
PDiagnosticM
Power Monitoring and Diagnostic Technology Ltd.
The PDiagnosticM is a portable system that utilizes UHF, AE, and HFCT sensor modules to monitor PD signals from Medium and High Voltage power equipment.The system is ideal for monitoring critical power assets to find and monitor intermittent PD signals and to analyze the developing PD trends. The PD type is determined by automatic pattern recognition and internal defects can be found at an early stage.The system provides advanced protection with alarm functions and our Deep Learning data analysis capabilities utilizing our proprietary Intelligent Cloud Diagnostic Technology.
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VXI
VXI stands for VME eXtensions for Instrumentation. It is an open standard first developed by five leading Test and Measurement companies in 1987 to standardise a backplane capable of developing open, interchangeable instrument modules that could be used to build Automatic Test Equipment (ATE).Data Patterns designs and markets a wide range of VXI modules, some of which are listed below. Due to the use of the latest technologies, Data Patterns VXI modules offer the highest I/O density available in the industry today.Further enhancements of functional capabilities are achieved by the use of VXI IP carriers and VXI M Module carriers. This extends standard functions available from Data Patterns in these mezzanine architectures to the VXI platform.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Advanced 3D Graphic
Geo Surface3D PRO
ScienceGL offers 3D visualization for extended GIS data that combines multiple layer terrain and multi-variable thematic map in one interactive 3D screen. Visualize Digital Elevation Model (DEM), land map, roads, satellite image, LIDAR data in the same screen. Combine terrain data with vector graphics, businesses thematic map, weather map, etc. Use transparancy to highlight more important data. The unique combination of GIS and multi-variable thematic maps helps to discover trends and patterns quickly and accurately. No other data presentation method comes close to expressing so much information within such a small space.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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RF
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and an attitude to utilise the latest technologies.
