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Probe Interfaces
Connect ATE instrumentation to interface test adapter.
- TEAM SOLUTIONS, INC.
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4-port Serial Interface, Modular, With/without Optical Isolation, 3.3V/5V, With 9-pin Connectors
APCI-7500-3/4C
*This model has 4x 9-pin D-Sub male connectors on 2 brackets*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)
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Linear Testfixture Testfixture for Mass Interconnect Cassette Interface Cassette and VPC ITA Frame Not Included, UUT 306 x 248 mm
MG-02-01 VPC G12
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 8 interface blocks of 160 or 170 signals• All interface blocks can be customized
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Tester Electrical Interfaces
The primary element of the tester electrical interface is the Probe Pin Ring (PPR). Sometimes referred to as a ‘tower,’ this array of spring-loaded probes can be arranged to provide a controlled impedance path, a low leakage connection, a low inductance arrangement for high currents, or just about any connection characteristic you require. inTEST EMS provides electrical interfaces in various OEM-supported designs, inTEST standards, and custom configurations.
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CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Bench-Top LPR Data Logger
MS6200L
The MS6200L is a bench-top data logger capable of measuring and storing data from all types of linear polarization resistance (LPR) corrosion probes. The instrument is microprocessor-based and features a simple, menu-driven interface using a 2-key keypad and a 2-line LCD display. It is housed in a rugged but lightweight plastic enclosure and is ideally suited for use in laboratory environments. The adjustable handle can be used for carrying the unit, or can be used as a tilt stand to adjust the viewing angle.
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Evaluation Board
emPower
SEGGER Microcontroller GmbH & Co. KG
The emPower eval board provides a comprehensive set of SEGGER's middleware products, accelerating the start of any embedded project. SEGGER's embOS real-time operating system is at the heart of the evaluation. Furthermore, evaluation versions of the file system emFile, graphics library emWin, emUSB Host & Device, and TCP/IP stack embOS/IP (including web server demo) enable full use of the available emPower peripherals. emPower also features a J-Link OB, an on-board version of SEGGER's market-leading debug probe J-Link, which includes drag & drop programming and COM-Port support. There are three expansion interfaces to easily connect additional modules. Each connector provides I2C, SPI, UART, GPIO/timer, analog input and power. A display adapter connector enables the connection of small TFT displays. The emPower board is powered by USB only. Current consumption drawn strongly depends on the application and connected peripherals. Idle consumption is approx. 85 mA.
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Interposers and Probes
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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Semi-Rigid Test Probes Up to 6 GHz
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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CAM/TRAC Test Kits
Series 47
The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
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PhyView Analyzer
The PhyView Analyzer dramatically simplifies the task of Ethernet 10/100/1000 interface testing in finished products without the need for test fixtures, test signals, scopes, and probes.
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Combination Board Tester
V250 / V250PXI
Qmax Test Technologies Pvt. Ltd.
V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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Fiber optic thermometer systems
TS Series
Micronor now offers a complete range of fiber optic temperature sensors, probes and interfaces for temperature measurement in challenging environments. TS series fiber optic temperature probes offer immunity to RF and microwave radiation along with wide temperature range, intrinsic safety and non-invasive use. The fiber optic temperature probes can operate over -200°C to +300°C (-328°F to +572°C), and withstand harsh and corrosive environments. Typical fiber optic temperature monitoring applications include:
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Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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Smart Polyglot - Wireless Probe
Signals & Systems India Private Limited
Smart Polyglot is designed to talk to meters of all protocols – PACT, ANSI, IEC. Not only does it talk over optical media, it interfaces with IR, IrDA meters as well, making it the only device that talks to any type of meter in any language.The Smart Polyglot has a wireless Bluetooth interface and enables seamless use with any DOS, Android, or Windows based devices with Bluetooth support. This Smart Polyglot Bluetooth probe can detect the commands from Bluetooth connected devices and establish a connection automatically for meter reading applications.
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Hardness Testers
Dalian Taijia Technology Co.,Ltd
Digital durometer for shore hardness testing pocket size model with integrated probe● Test scale: shore hardness● Standards: DIN53505, ASTMD2240, ISO7619, JISK7215● Parameters displayed: hardness result, average value, max. value● Measurement range:0-100HA(HD)(HC)● Measurement deviation:＜1%H● Resolution: 0.1● Auto switch off● With RS232C interface● Operating conditions: 0℃ to 40℃● Power supply: 4x1.5V AAA (UM-4) battery● Battery indicator: low battery indicator● Dimensions: 162x65x38mm● Weight (not including probe):173g● Application:Shore A is designed to measure the penetration hardness of rubber, elastomers and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D is designed for plastics, Formica, Epoxies and Plexiglass.shore C is designed for various foam and sponge.
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Broadband Field Meter
NBM-520
*Intelligent probe interface detects the probe parameters*Fully automatic zero point adjustment*PC software for convenient data management
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Data Logger for Ultra Low Temperature
DSR-ULT
Special probe using military industrial technology supports measuring temperature ultra low to -100 Original fittings for sensor connection, ensures 100,000 plugs Support single DSR connecting to PC via USB interface, and multiple DSR grouped in RS485 or LAN networking for central management Suitable for medical refrigerator, biological specimens preservation, scientific research and other applications
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
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DH Series QuickLink Adapter, 8 GHz BW
DH-QL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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CPU Debugger
Green Hills Probe V4
The Green Hills Probe is an advanced hardware debug device that connects to the onboard debug ports present on most modern microprocessors, such as IEEE 1149.1 JTAG and BDM. With support for more than one thousand devices from over thirty manufacturers, a flexible electrical interface, and out-of-the-box support for the largest multicore systems, the Green Hills Probe provides fast, reliable debugging, programming, and system visibility to projects present and future.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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VELOCICALC Multi-Function Ventilation Meter
9565-X
The portable, handheld VELOCICALC® Multi-Function Ventilation Meter 9565-X features a menu-driven user interface for easy operation in your local language. On-screen prompts and step-by-step instructions guide the user through instrument setup, operation, and field calibration. The 9565-X also features an ergonomic, overmolded case design with probe holder and a keypad lockout to prevent tampering during unattended use. The 9565-X does not include a probe or pressure sensor.
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Motherboards
ITC currently manufactures over 100 different motherboard types, including interfaces to all major brands and types of testers. Additionally, ITC has the ability to quickly design and manufacture motherboards for any new tester interface including custom probe cards.
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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Probe Antennas
Probe antennas are offered as both standard and custom models with a rectangular waveguide interface. Probe antennas can only support linear polarization. These antennas are often used to measure the gain of other antennas by comparing the signal levels of the probe antenna and antenna under testing. The standard models operate across the full waveguide band and offer 6.5 dB nominal gain and 115 and 60 degrees half power beamwidth at center frequency. The below standard offering covers the frequency range of 8.2 to 170 GHz.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Dual Input Logging Thermometer
DT302
UEi Test & Measurement Instruments
This series of Digital Thermometers offers a unique combination of features including logging capabilities with 9,999 memory positions and a USB interface and software, one, two and four inputs offering relative and differential readings. The Apollo also offers a solution to storing probes and is manufactured to conform to the IP67 standard, meeting performance expectations of water submersion and high-pressure dust resistance.
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Digital Oscilloscope
DS1000Z
The DS1000Z series of digital oscilloscopes use the Ultravision technology platform, which continues the characteristics of deep storage and high waveform capture rate, and has an excellent cost performance advantage. The innovative DS1000Z Plus series comes standard with a digital channel interface that can be upgraded to a full-featured MSO with the addition of an RPL1116 logic probe.
