Filter Results By:
Products
Applications
Manufacturers
- CAMI Research Inc.
product
Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large library to match your connector. Then touch the tester probe to the connector pins one-by-one to automatically detect and assign a test point to each pin. A synthetic voice reads probed pins as you touch them so you don’t need to take your eyes off the connector you’re probing. Finally, enter pin labels of your choice if you wish to override the standard designations.
-
product
Test Leads and Probes
Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
-
product
Ultrasonic Dual Element Probes
SONOSCAN T
The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
-
product
IEC60068-2-75 Spring Hammer Test
CX-T03
Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
-
product
DDR5 Logic Analyzer
FS2602
The FS2602 is our the latest logic analyzer probe used to test DDR5 SO-DIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 SO-DIMMs running at ~4000MT/s.
-
product
Extraction Tool
It is a simple and convenient item that allows you to search for and replace the test probe at the same time. With needle-nose pliers, when pulling out a pin in a narrow space, excessive force was applied, which could damage the adjacent pin or widen the hole diameter. With our original pulling tool that supports the minimum pitch, you can easily pull out without damaging the adjacent pin.
-
product
5lb Conductive Rubber Electrode
PRS-801W
Probe to test resistance of floors, worksurfaces, floor mats, or other flat objects.
-
product
Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
-
product
Phasing Voltmeter/Sensor (2 in 1)
STB Electrical Test Equipment, Inc
STB unit replaces 3 separate units manufactured by competitors - line phasing, capacitance phasing and line to ground Versatile, lightweight and easy to useEach portable meter has a single rangeMeter usage: Voltage detection and phasing at capacitance test points or voltage detection and phasing on bare energized conductors (overhead & underground)Probes can be separated to be used as a voltage sensor or capacitance sensorFive position selector.
-
product
Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
-
product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T156-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
product
Conductivity Type Tester
HS-HCTT
It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
-
product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74E-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
product
Retractable Cable
3700
Peaceful Thriving Enterprise Co Ltd
*2 x 6m retractable test leads.*Used as an extension cord for cars, trailers, boats and more.*Optional accessory included alligator clips, test probes and banana plugs.*The tester can be used with any multi meter or device equipped with banana jack connectors.
-
product
CAT III Digital Multimeter
82600
Measures AC/DC voltage/current up to 600V and 10A, capacitance, diode, duty cycle, frequency, resistance, temperature and transistor. Includes 13 Functions and an operating temperature range between -40° to 1000°C. Features manual or auto shutdown after 15 minutes of inactivity, protection against overload at all ranges, data hold, low battery indicator and warning alarm. Also includes a LED flashlight for low light situations. Rubber outer case adds protection against drops and a stand bracket to hold meter at viewing angle and test probe holding clips.
-
product
6-24V Car Circuit Tester
1952
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable for earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
-
product
2.5mm Test Wire Test Probe Pin
CX-3C
Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test wire test probe pin 1.Application: Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool.
-
product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T80
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
product
Gaussmeter
DX-102
DX-102 Gaussmeter is a portable gauss meter, based on the latest progress of Hall effect magnetic field measuring instrument, adopted DSP technology. Test probe adopts import GaAs linear Hall chip, the difference between any two probes is small, if damaged, it can be replaced directly. DX-102 Gaussmeter is an ideal DC magnetic field test instrument.
-
product
MEMS Spring Probe
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
-
product
Pulsed SMU Systems
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
-
product
HandyScope HS6-DIFF With EMI & SafeGround: 1 GS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-1000XMEG-W5
The powerful capabilities of the WiFiScope HS6-DIFF-1000XMEG EMI analyzer give the user the possibility to quickly perform a good EMI compliance test. With this cost effective test, time and money are saved by avoiding extra visits to expensive EMC testing facilities. The supplied EMI probe set TP-EMI-HS6 contains three magnetic field (H field) probes and one electric field (E field) probe. The tripod ensures that the probes can be positioned properly at the object under test.
-
product
Portable Test Platform
FTB-4 Pro
The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.
-
product
12.5 mm Test Sphere Probe
CX-12.5
Shenzhen Chuangxin Instruments Co., Ltd.
The rigid sphere (12.5 mm) from Autostrong is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950) to prove the degree of protection for the first characteristic numerals 2 (IP2X) .Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.
-
product
Test Probe Connector, High Voltage, Voltage, 3 %
72-6530
The 72-6530 is a high voltage Testy Probe with built-in meter measures voltages up to 40kVDC.
-
product
Test Hook Probe
CX-S11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
-
product
Alternate 17.00 (482.00) - 35.00 (992.00) Switch Probe
MSP-3C-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Alternate Force at switch point: 23.3 (661)Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 140Full Travel (mm): 3.56Recommended Travel (mil): 85Recommended Travel (mm): 2.16Mechanical Life (no of cyles): 100,000Overall Length (mil): 2,140Overall Length (mm): 54.40Switch Point (mil): 30Switch Point (mm): 0.76
-
product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
-
product
Adapter/Stainless Steel
WADP-24M29M
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
-
product
CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
-
product
Probe Only Manipulator
LSP
The LSP mounts to standard prober hinge mounts with easy access to service and engineering locations. This reduces the floor space per test cell, saving you significant capital expenses. And you’ll be able to quickly and easily set up your ATE to wafer probe.
