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DC Power Supplies
Is the unidirectional flow or movement of electric charge carriers (which are usually electrons). The intensity of the current can vary with time, but the general direction of movement stays the same at all times. As an adjective, the term DC is used in reference to voltage whose polarity never reverses.
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Microscopy
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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High Power Microwave Plasma System
The High Power Microwave Plasma System features the High Power Microwave Plasma Source, generator (with isolator) and auto-tuning system comprised of the Precision Power Detector and SmartMatch® unit. This comprehensive system delivers a high concentration of radicals with low electron temperatures for the highest dissociation and lowest recombination rates.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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Radiation Microdosimeters
Teledyne e2v HiRel Microdosimeter is a compact hybrid microcircuit which directly measures total ionizing dose (TID) absorbed by an internal silicon test mass. The test mass simulates silicon die of integrated circuits on-board a host spacecraft in critical mission payloads and subsystems. By accurately measuring the energy absorbed from electrons, protons, and gamma rays, an estimate of the dose absorbed by other electronic devices on the same vehicle can be made. The Microdosimeter can operate from a wide range of input voltages. The accumulated dose is presented to three dc linear outputs and one pseudo-logarithmic output giving a dose resolution of 14 µrads and a measurement range up to 40 krads. These outputs are intended to be directly connected to most analog-to-digital converters (ADCs) or spacecraft housekeeping analog inputs (0-5 V range), which makes minimal demands on the host vehicle. The Microdosimeter incorporates a test function to allow electrical testing of the hybrid without the need for a radiation source.
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Materials Technology
The quality of the materials used is crucial for the technical innovation of a component. Our materials experts will support you in analyzing and optimizing materials so that every product can be manufactured in the highest quality. We will also be by your side as a competent partner in complex electron microscopic investigations and advise you in the practical development of modern materials.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Fluorometers
A fluorometer measures the light or radiation emitted by fluorescent objects. Fluorescence occurs when light of a specific wavelength strikes and electrons in the sample.MRC provides a wide range of Fluorometers for Laboratories.
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Filament Transformers
Osborne designs and produces high impedance and unregulated Filament Transformers. An unregulated filament transformer supplies a specified voltage and current to the filament of an electron vacuum tube. High impedance filament transformers are designed around a tungsten tube filament. Osborne often works with our clients to increase the life-span of their vacuum tubes through the use of a regulated voltage supply.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Simulation Software For Cyclic Voltammetry
Digisim
Cyclic voltammetry can readily provide qualitative information about the stability of the oxidation states and the electron transfer kinetics of a redox system. However, quantitative studies using cyclic voltammetry (e.g., mechanistic investigations) are more difficult and typically require the use of simulation software. A number of methods have been developed for the simulation of cyclic voltammograms. Of these methods, the fast implicit finite difference method has been shown to be the most efficient, stable, and accurate, and this method is used for the DigiSim simulation software from BASi®.
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Avalanche Photodiodes
These avalanche photodiodes (APDs) are silicon photodiodes with an internal gain mechanism. As with a conventional photodiode, absorption of incident photons creates electron-hole pairs. A high reverse bias voltage creates a strong internal electric field, which accelerates the electrons through the silicon crystal lattice and produces secondary electrons by impact ionization. The resulting electron avalanche can produce gain factors up to several hundred.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Analysis System
Trident (EDS-EBSD-WDS)
The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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X-Ray Systems
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
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Analytical Services
Surface Analysis; X-Ray Photoelectron Spectroscopy (XPS, ESCA), Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS), Dynamic Secondary Ion Mass Spectrometry (D-SIMS). Microscopy & Diffraction; Organic Material Analysis; Bulk Chemistry.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Gamma Detectors
In Gamma detectors, the gamma radiations produce electrons by interacting with the cathode material and the filling gas.These electrons ionize the gas and the charge carriers are collected by the electrodes. The resulting anode pulse is detected by a load circuit. The primary electrons are created by several interaction mechanisms:- Photoelectric effect- Compton scattering- Pair production
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Silicon Detectors
Through the photovoltaic effect, detectors provide a means of transforming light energy to an electrical current. The root of the theory behind this phenomenon is a small energy gap between the valence and conduction bands of the detector. When light, with enough energy to excite an electron from the valence to the conduction band, is incident upon the detector, the resulting accumulation of charge leads to a flow of current in an external circuit. Since light is not the only source of energy that can excite an electron, detectors will have some amount of current that is not representative of incident light. For example, fluctuations in thermal energy can easily be mistaken for light intensity changes. A variety of these "non-light" contributions are present and, when summed up, make up the total noise within the detector.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Tube Tester / Tube Checker
RM 1
Using the RM 1 Tube Checker it is immediately possible to do an exact plate current measurement without doing the often very toilsome procedures mostly necessary with classical devices. Put the electron tube, which should be measured, simply into the accordingly marked test socket, switch the equipment on, select the socket by using the rotary switch (it is indicated by a LED), wait for approx. three minutes till the tube is working stabile and read off the value on the panel meter.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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PLD/PED Components
Neocera offers a variety of components that can be fitted and combined into new or existing PLD and PED systems to provide improved functionality and enhanced capability. Components include:*Oxygen-compatible substrate heaters for epitaxial oxide film depositions..*Automated Target Carousels for preparing multilayer heterostructures.*Deposition chambers design specifically for PLD and PED systems.*Manual and automated laser window-change Accessories.*Pulsed Electron Deposition (PED) sources for laser transparent materials.*Ideal for retrofitting existing systems or construction of new systems.
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Magnetic Field Cancelling System
MR-3
3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.
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Level Detectors
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik offers selective RF level detectors for air interface monitoring. The detectors are especially designed for frequencies used in e.g. electron accelerators. Due its mechanical design, the modules are compatible to cable route mounting systems. The detection of unintentional RF radiation is a main application field.
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Magnetic Field Testing
Response Dynamics Vibration Engineering, Inc.
As magnetic field consultants, we have been working with magnetic field issues for sensitive tools for many decades from cutting edge development of scanning electron microscopes (SEMs) to active cancellation systems for MRI tools, to site surveys for specification compliance, debugging, and tool Magnetic Field Sensitivity Testing.
