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- Applied Rigaku Technologies, Inc
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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High Voltage Thick Film Planar Resistors
HVP
*High resistance resistors for high voltage circuits.*Thin SIP shape*The flame retardant coats corresponding to UL94V-O are used*Thick film resistors ensure high stabilities in life and change in aging
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Thick Film Inspection
785
For thicker coatings such as coal tars, extruded and tape coatings, the Model 785 has a range of infinite voltage settings from 1,000 to 15,000 volts.
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Metrology System
IMPULSE V
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Pure Boron Foils
MICROMATTER™ boron foils are also produced by laser plasma ablation; however, the deposition process is much more complex and time consuming than that for diamond-like carbon. Accordingly, only thin films, mainly designed for beam stripping of heavy ions in electrostatic accelerators, are available. All films are generally delivered on glass substrates coated with a release agent.
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Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Falling Dart Impact Tester
DRK135A
Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Bow and Global Film Stress Measurement
128 Series
Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
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Non-contact Conductivity Type (P/N) Checker For Quick Check
PN-50α
*Principle: Photovoltaic effect by light pulse irradiation*No damage and no stain by Non-contact method*Possible to check even oxidized film on wafer surface*Instantly discrimination by optical pulse illuminate
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Physical Vapor Deposition Systems
Physical Vapor Deposition Systems offer maximum flexibility for a wide range of thin film deposition applications with advanced process capabilities, unsurpassed uniformity and multiple deposition modes.
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RF Amplifiers
UST specializes in the testing, repair and refurbishment of all types of RF amplifiers (broadband and narrowband), microwave amplifiers and millimeter-wave amplifiers: solid state, thin film, traveling wave tube (TWT), low noise RF amplifiers, intermediate power RF amplifiers, limiting RF amplifiers, doubler RF amplifiers, driver RF amplifiers, variable gain RF amplifiers, and active frequency multipliers.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Coating Thickness Gauges
Coating thickness gauges are used to test the dry film thickness of most metals, plus concrete, fibreglass, glass, and plastic. The gauges can measure coatings on ferrous substrates, such as steel, and non-ferrous substrates, such as stainless steel and aluminium and non-metals such as concrete, fibreglass, glass, plastic, gyprock and timber.
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Ozone Gas Delivery Systems
MKS ozone gas delivery systems provide field-proven, high concentration, ultra-clean ozone generation for advanced thin film applications such as Atomic Layer Deposition (ALD), Chemical Vapor Deposition (CVD), Tetraethyl Orthosilicate (TEOS)/Ozone CVD (HDSACVD), contaminant removal and oxide growth. Gas delivery models have integrated ozone concentration monitoring, flow control, and power distribution. Additional system options include safety monitoring, status indicators and ozone destruction capability.
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Benchtop Metrology System
FilmTek 2000 SE
Scientific Computing International
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings. Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and intuitive material modeling software to make even the most demanding of measurement tasks simple and reliable.
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L-Band Red/Blue-Band Pass MWDM
WD1616/R, WD1616/B
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1616/R, WD1616/B is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to the combination and separation of L-Band, Red-Band (1589~1603nm) and Blue-Band (1570~1584nm).
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Flashlight Solar Simulator
Flashlight Solar Simulators have the advantage of negligible temperature change to the solar cell. For this reason, they are primarily used in cell and module production environments. Also, they are a more budgetary alternative if large cell areas are to be illuminated, because it is easier to have excellent light uniformity on areas of 8 in x 8 in or larger. So, this type of solar simulator is also used for analysis of large area thin film solar cells. But care must be taken, as some materials (e.g. CIGS) have long inherent time constants, so that the pulse length (better: flash plateau) must be chosen accordingly.
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In Situ Diagnostics
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Vibrating Sample Magnetometer
VSM-P2H
This is low magnetic field type of exclusive use for soft thin film sample by the use of Helmholtz Coil.The type is capable of measuring variations of temperature from -50°C to 200°C by adding gas-flow type of temperature controller as an option.
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1550/1310~1490nm Wavelength Division Multiplexer
PON-WDM-1543
Hangzhou Huatai Optic Tech. Co., Ltd.
PON-WDM-1543 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Film Tearing Strength Tester
DRK108C
Shandong Drick Instruments Co., Ltd.
DRK108C Tearing Tester is applicable in the tearing test of films, sheets, flexible PVC, PVDC, waterproof films, woven materials, polypropylene, polyester, paper, cardboard, textile and non-woven, etc.
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Thin Film Based Thermopile Detector: 3 Channels
TM34
A three-channel thin-film thermopile in a TO-8 package. Each symmetrically positioned active area is 3.16mm x 0.4mm. Offers low noise output and internal aperture minimizing channel-to-channel crosstalk while increasing sensitivity.
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Belt Tension Tester
BTT2880
Main used in belt tension measurement, can also be applied to measure the tension of objects such as tapes, wires. Widely applied in industries of automobile, textile, cables, wires, plastic films, paper, printing.
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High Voltage Film Capacitor
STHVP/STHVE
High Voltage Pulse Current for medium frequency applicationHigh Voltage DC / AC Voltage applicationCapacitor can be discharged at rated voltage directly without any protective component and with ambient Temperature up to +105CHigh Voltage Decoupling and SnubberingVoltage MultiplierInduction heatingAct as discharge capacitor to trigger laser, X-Ray and Tesla CoilFor high voltage capacitor bank or arrayHigh Voltage Power Supplies
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Chip Resistors
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide range of Chip Resistors including conventional Thick Film Chip Resistors, Specialized Resistors such as Thin Film, Current Sense, Anti-Sulfur, Anti-Surge and Metal Film Chip Resistors.Panasonic’s standard Thick Film Chip Resistors are offered in cases sizes from 01005 to 2512.
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Thick Film Divider
GBR-391
GBR-391 series high-voltage resistive dividers are made in a thick film technology on ceramic substrates (Al2O3 - 96%) with leads for through-hole mounting. Dividers are characterized by very high maximum voltage, and standard voltage division.
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Air-bath Film Heat Shrinkability Tester
DRK166
Shandong Drick Instruments Co., Ltd.
DRK166Air-bath film heat shrinkage performance tester, according to ISO14616 air heating principle test method to test the shrinkage performance of heat shrinkable films of different materials, to study the relationship between heat shrinkage force and cold shrinkage force of heat shrinkable films of different materials, and to determine the direction of the test when shrinking.
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Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000L
*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts*Target: Electric crosshair on monitor
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Thick Film Chip Resistors
Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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Direct Reading Attenuator
DAXE
DAXE Millimeter-Wave Direct Reading Attenuator is a measurement instrument for signal level setting or loss measurements in waveguide networks. It also can be used for calibration of other attenuation measurement instruments. Direct Reading Attenuators have rotary-vane design. The value of attenuation is determined by rotation angle of resistive film with respect to the waveguide channel. Attenuation value does not depend on of frequency.The Attenuators are provided in waveguide bands between 18 GHz and 225 GHz.
