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Wave Profiler
The Wave Profiler allows the user to measure non-directional wave parameters continuously for long periods of time with high temporal and spatial resolution in deeper water from the safety of an underwater mooring. The instrument is particularly useful for clients who need to measure long-period waves (such as rogue waves or infra-gravity waves), waves in wash and in wakes, and non-linear waves.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Thermal Profiler
KIC K2
The latest-generation mobile-friendly profiling technologyThe KIC K2 Thermal Profiler features a compact and robust design that allows it to fit through the tight, heated chambers of lead-free reflow ovens. A plug-and-play hardware and graphical user interface makes profiling both quick and easy. The profile data measured by the K2 can now be viewed on either a PC or on a mobile device using the Profile Viewer App.
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Radiometer
HyperOCR
Hyperspectral ocean color radiometer (HOCR) sensors are designed for applications where performance, size and power are key constraints. HOCRs can be mounted on real-time profilers, moored on autonomous deepwater buoys, installed in autonomous underwater vehicles, as well as on ships and airplanes for above-water optic applications. HyperOCR sensors are fully digital optical packages, providing 136 channels of calibrated optical data from 350–800 nm.
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Guidance Laser with Manual Line Adjust
GL3000PM
The GL3000PM Guidance Laser uses an ultra high visibility green laser to establish visual line control. Used for highway paint striping, asphalt pavers, road wideners, pavement profilers, or virtually any application requiring vehicle line control. The GL3000PM is also particularly effective for gun carriage alignment on paint striping trucks.
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Light Analysis
Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Non-contact 3D Optical Profilers
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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Beam Profiler Software
RayCi
CINOGY’s beam profilers are available with the specifically designed beam profiling software RayCi, which utilizes new developed correction algorithms and incomparable visualizations modes. This ensures the highest accuracy in beam profile analysis according to ISO standards.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Acoustic Zooplankton Fish Profiler
The ASL Acoustic Zooplankton Fish Profiler™ (AZFP™) offers a new, economical way of obtaining reliable measures of marine environmental conditions in the water column. The AZFP™ can monitor the presence and abundance of zooplankton and fish within the water column by measuring acoustic backscatter returns at multiple ultrasonic frequencies. Other sonar targets realized from the sonar backscatter data include bubbles and suspended sediments.
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Pulse-Coherent Acoustic Doppler Profiler
PC-ADP
The PC-ADP (Pulse-Coherent Acoustic Doppler Profiler) is an ADP optimized for high-resolution, 3-axis (3D), short-range, boundary layer studies.
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Shallow Water Ice Profiler
The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
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Sub-bottom Profiling
The EdgeTech Sub-bottom Profiling System is a wideband Frequency Modulated (FM) sub-bottom profiler utilizing EdgeTech’s proprietary Full Spectrum CHIRP technology. The systems generate high-resolution images of the sub-bottom stratigraphy in oceans, lakes, and rivers.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Profiler
fastCTD Profiler
An evolution of the miniCTD, it has a conductivity cell designed for optimum flow-through, a fast response thermistor temperature sensor and a 0.01% pressure sensor synchronously sampling at 32Hz deliver the highest quality profiles in a lightweight and robust package. The package is completed with an integral fluorometer based on Valeport’s new Hyperion range and optional Bluetooth communications module.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Multibeam Echosounder - Deep Water
HydroSweep DS
The HydroSweep DS is a deep water multiebeam echosounder ideally suited for seabed mapping in deep water up to full ocean depth based on a sonar frequency between 14 kHz to 16 kHz. Beside bathymetric depth information from 10 m to more than 11,000 m, sidescan data and backscatter data for seabed classification are acquired. The HydroSweep DS does not only gather sea floor information, but also uses adaptive bottom tracking windows to identify sonar targets in the water column and can be optionally operated as a parametric sub-bottom profiler without additional transducers and electronics.
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Multi-Parameter Profiler
fastCTDplus Phycocyanin
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Phycocyanin observations at fast drop rates. A conductivity cell designed for optimum flow-through, a fast-response thermistor temperature sensor and 0.01% pressure sensor together with a Fluorometer sensor, all synchronously sampling at up to 32Hz to deliver the highest quality profiles in a lightweight and robust package.
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Remote-Controlled Dual Motor Remotely-Operated Boat
Q-Boat 1800RP
The Oceanscience Q-Boat® 1800RP is designed to offer a reliable, high specification remotely-controlled platform for the deployment of popular acoustic Doppler current profilers from any of the major instrument manufacturers. Made of high-impact UV resistant ABS, the Q-Boat 1800RP features twin high power outdrives to give a 5 m/s (16 fps) top speed with the security of two engines. The flexible propulsion system allows the Q-Boat 1800RP to be equally effective at very low velocities (30 cm/s), providing a total solution to river discharge measurement. Ready for GPS and Oceanscience Hydrolink radio modems, the Q-Boat 1800RP is available with an optional extended range remote control system that allows control at over 750m distance.
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LIXI Profiler
The LIXI Profiler uses our proprietary technology, Radiometric Profiling, the only NDT technology that allows you to see everything you need to manage a healthy pipe system without touching a thing.
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Thermal Profiler
MEGAM.O.L.E.® 20
Do you demand the highest density of thermocouples placement possible on your Hi-Reliability, High-Value PCB? ECD's got your Spec! Do you expect a software package that flexes with your workflow, providing customizable data extractions, Imports of your .MDM M.O.L.E. libraries and compatibility with your intranet, Excel, and all ECD M.O.L.E. profilers?
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3D Optical Profiler
Nexview™ NX2
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Combined Sonars
We offer the most advanced side scan sonar and sub-bottom profilers manufactured to function as one fully integrated system. For hydrographic survey quality systems designed for small to mid-size AUVs, our team has your solution.
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Power Profiler, DC Energy Analyzer, Power Supply, Digital Multimeter, Source Measure Unit, Power Debugger
Otii Arc Pro
Otii Arc Pro is an instrument that can precisely source voltage or current and simultaneously measure voltage and/or current. It computes power and energy and syncs with software output, enabling engineers and developers to easily see what drains the energy and optimize the battery life of their devices under test.
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3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
