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TAPs
network jump enabling undetectable data monitoring. AKA: Test Access Points
See Also: Network Monitoring, Network Taps, Aggregator Taps
- Dynalab Test Systems, Inc.
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Hipot Tester
NX Hipot+
50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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Universal Development Board For The Plug-in Module PCAN-MicroMod FD
PCAN MicroMod FD Evaluation Board
The PCAN-MicroMod FD Evaluation Board is a development board for the PCAN-MicroMod FD and enables the design and development of your own circuits with CAN connection and I/O functionality. It can also be used for training purposes for CAN and CAN FD structures. The user can access the resources of the attached PCAN-MicroMod FD via taps, screw terminals, switches and potentiometers and test configurations or test circuits.
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PXIe-8623, 4-Port, 100/1000BASE-T PXI Automotive Ethernet Interface Module
787992-01
PXIe, 4-Port, 100/1000BASE-T PXI Automotive Ethernet Interface Module - The PXIe-8623 is a 100/1000BASE-T unshielded twisted pair (UTP) PXI Automotive Ethernet Interface Module that helps you develop applications with the NI‑XNET driver. With the PXIe-8623, you can develop applications that require Ethernet to test and validate automotive electronic control units (ECUs). The PXIe-8623 provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, making synchronization with an external network as well as the rest of a PXI system possible. Additionally, the PXIe-8623 features LEDs on the front panel to help you monitor the network link and activity.
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Bypass Network TAPs
Bypass TAPs (bypass switches) are used to connect a monitored network segment to an active, in-line security device and monitor the device's health. If your security tool goes off-line, the bypass TAP automatically 'switches to bypass mode' keeping your network link up while you resolve the issue. Garland's Bypass TAPs with failsafe technology guarantee 100% network up-time and let your security devices see every bit, byte, and packet.®
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802.11a,b,g RF Shielded Test Enclosure
JRE 0814-A
Testing tall devices? The 0814-A stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices.
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RF Taps
Praxsym’s RF Taps afford access to a cable system for monitoring function and performance without interrupting service. The taps also cause minimal insertion loss when the coupled port is open, as in normal system operation. Like all Praxsym products, these high-quality devices have honest specifications, and are well-documented over the bands they are designed for.
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2.4 And 5GHz Handheld Wi-Fi Tester
*Supports 802.11 a/b/g/n and 2.4 / 5GHz frequency bands.*Quickly troubleshoot Wi-Fi problems using the 7” Inch colour touch screen*Screen resolution 800 x 480 (WVGA)*monitor intermittent line problems up to 20 days with the xDSL Histogram feature*One button configurable test / Automatic test script performs the following Tests:**Noise**WiFi Channel Utilisation**Access point login,**Ping Test**HTTP Download Test*Rapid Testing - Reports and statistics displayed in typically less than 3 minutes*Stores over 1000 Test reports in PDF Format*USB port for additional storage options
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Aggregation TAPs
Aggregation TAPs designed for lossless traffic aggregation from multiple in-line links or out-of-band connections into a single output, optimizing port usage on monitoring tools.
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Passive Network TAPs
ApconTap
Our portfolio of passive optical network TAPs captures network traffic under all conditions to simplify network monitoring and security. Each ApconTap model supports common datacenter optical fiber standards with split ratio options availble at 50/50, 60/40, and 70/30. With passive fiber 40G and 100G TAPs, APCON offers short-range, long-range, and bidirectional models to accomodate requirements for high-density, next-generation datacenter deployments.
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ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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ABex Terminal Module for Göpel 1149Cx BSCAN Cards
ABex TM-1149Cx
The ABex TM-1149Cx is an ABex terminal module for the Göpel Boundary Scan Controller SFX/PXI(e) 1149/C2/X or SFX/PXI(e) 1149/C4/X. It is connected to the BSCAN-Controller with an adapter-paddle-card.In combination with the above Göpel Boundary scan cards it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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100 Pin Breakout Interface
VSI-Breakout-100
The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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SWB-2810, 4x43, 1 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-10
4x43, 1 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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CapaConnect repair defective capacitive string parts
CC-LRP3/4+KS+DS
Hachmann Innovative Elektronik
With modules of CapaConnect series you can repair defective capacitive string parts of older installations, or retrofit string parts, where until now only direct cable taps are available. The connections to coupling dielectrics and earth can be carried out without an expensive dismantling normally, as the module contains all necessary components, like surge arresters, plug-in positions for adjustment capacities and high-quality contacts.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Boundary-Scan Test and In-System
PCIe-1149.1
The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Multiplexers
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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T8730 AIR FLOW TESTER UNIVERSAL
T8730 was designed for the precise task of measuring flows on parts such as filters (medicinal, diesel or petrol), tubes, nozzles, openings, valves, etc…Other than the classic flow measurement, the tool also has other ways of making it as versatile as possible in its category: ascent and descent ramps, opening tests and burst testing.Another separate function is the "continuous measurement", i.e. a test with infinite times allowing adjustment of the taps and part repairs in real time.The tool also avails of an intelligent pressure adjustment, which uses the automatic pressure regulator to continuously adjust the test pressure based on the variation in load loss, to ensure the reading is as stable and repetitive as possible.
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DIOS (Digital I/O Scan Module)
JT 2122/MPV
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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50 Pin Breakout Interface
VSI-Breakout-50
The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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ABex Terminal Module for Göpel 1149Cx-FXT BSCAN Cards
ABex TM-1149Cx-FXT
The ABex TM-1149Cx-FXT is an ABex terminal module for the Göpel Boundary Scan Controller SFX/PXI(e) 1149/C4-FXT-X. It is connected to the BSCAN-Controller with an adapter-paddle-card.In combination with the above Göpel Boundary scan card it’s possible to connect up to four JTAG/Boundary Scan TAPs. All differential signal wires on the PCB are impedance controlled. In addition, all other digital signals (PIP, TRG, Aux, I/O) and Ground can be switched off via relays.
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25 Pin Breakout Interface
VSI-Breakout-25
The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Test Fixture with API
TA-14VG
The TA-14VG test fixture is based on the requirements for the Integrated Test Procedure for the VG-14A assembly as shown in the OEM maintenance manual. The panel also contains a test point breakout for the units main connector as well as one for the VG-401 base. The VG-401 breakouts provide an in series connection that will allow easy access to the gyro's signals and also provides a way to monitor rotor current. The panel also contains a variac to allow for line voltage adjustment.
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Serial / USB Communications
Advantech offers serial / USB converters, isolators, repeaters, surge suppressors, data taps /splitter, USB hubs, and industrial communication cards.
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Hipot Wire Harness Testers
NX Hipot
* 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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Temperature Forcing System
ETF-SERIES
Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
