Celadon
Celadon Systems is a well-established 20 year old US based company known for providing “Peace of Mind” Probing Solutions to the semiconductor industry. Celadon’s probe cards are known for thriving in temperature extremes while still delivering accurate and precise test results. Expect Millions of Touchdowns with Celadon. Celadon delivers the Lowest Cost of Test in the industry. Celadon is an industry leader in parametric probe both in production and in the lab, device test, burn-in, modeling & characterization, and wafer level reliability.
- 952.232.1700
- 952.997.6225
- salesteam@celadonsystems.com
- 13795 Frontier Court
Burnsville,, MN 55337
United States
-
product
Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
-
product
Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
-
product
3KV High Voltage Test
45EHV/VC20EHV: 4.5inch High Voltage Motherboard for Celadon Element™ 20mm VC20EHV VersaCore™ and VersaJet™ System
-
product
Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
-
product
Diagnostic Cores
Diagnostic VersaCore™
The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system*Test SMUs*Test Motherboard*Test Pogo pins*Test Relay matrix
-
product
Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
-
product
Cryogenic Applications
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
-
product
Probe Card
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
-
product
Production Parametric Probe Card
VC20TM Fab
*Maximum channel count: 48*Tester platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, Rack and Stack configurations.*Minimum Pad Size: 30ux30u (tunable scrub)*Contact Resistance: less than 1 ohm*Temperature range: -65C to 200C*Leakage: Less than 5 femto Amps per volt. If you require faster settling time*Repairable*Lifetime Performance: Production customers are experiencing 10M+ million touchdowns on Aluminum and Copper pads. Few to no rebuilds due to pobe wear
-
product
Probe Card
Tile-on-Card™
Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.
-
product
Probe Card
T90™ Series
The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
-
product
Cryogenic 4K Probe Cards
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
-
product
Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
-
product
Multisite Testing – Rail System
Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
-
product
Patch Panels
For maximum channel flexibility, Celadon can design and build custom patch panels to meet your WLR requirements.
Parent
-
MPI Corp.
MPI Corporation was founded in July, 1995 and has enjoyed growth well beyond the industry standard due to an infusion between customer centricity, the latest technology development, advanced manufacturing techniques and world class customer support. In addition, having four vertical markets spanning across many different industries has enabled MPI steady growth.
Siblings
-
Celadon Systems, Inc.
Celadon Systems, Inc. based in Apple Valley, Minnesota, is a worldwide leader in high performance probing solutions for monitoring DC parameters of semiconductor devices at the wafer level.
Siblings
-
MPI Photonics Automation
MPI Photonics Automation (PA) Division is the world’s leading manufacturer of automated test and measurement equipment for the Photonics, Optoelectronic, Semiconductor, and Laser industries. MPI’s leading-edge technology enables a global installation base of more than 10,000 photonics systems worldwide operating 24/7.
Siblings
-
MPI Probe Card Technology
MPI probe card division provides a wide range of solutions to the semiconductor wafer level test market. Integrated Circuit (IC) applications include Drivers, Logic, CIS, RF, Flip Chip and Cu Pillars. MPI’s comprehensive designs, robust manufacturing and state-of-the-art tooling, enables MPI to provide unsurpassed solutions globally for your challenges both today and for many generations to come.
Siblings
-
MPI Advanced Semiconductor Test
The Advanced Semiconductor Test (AST) division is built based upon a unique combination of *Manufacturing Excellence and *Systems Reliability incorporated from MPI’s worldwide market leadership position in LED Test Equipment with a global installed base of more than 10,000 systems for 24/7 operation and *Decades of Engineering probe systems Market Expertise from the AST management team.
Siblings
-
MPI Thermal Test Systems
MPI Thermal temperature systems have advanced technology in precise localized hot and cold temperature test equipment. The thermal division has 60 years of combined thermal control system experience. This has brought about a thermal air stream system for today’s manufacturers environmental test chamber needs. We have designed a system that provides accurate temperature control at the test site as a convenient alternative to larger temperature chambers and liquid baths.
